Open Inventor Toolkit provides advanced 3D rendering and 2D/3D image analysis capabilities in a comprehensive SDK, perfectly suited to empower advanced image-based defect analysis applications

3D image pre-processing and visualization

Open Inventor Toolkit offers the full range of 2D/3D image data import, pre-processing and visualization:

Import images from any acquisition modality (X-Ray CT, MRI, PET, ultrasound…)
Image filtering and enhancement
High-quality volume rendering
Visual inspection tools: Volume Probing, Magnifier, ‘Magic Glass’, Iso-surface extraction…

Segmentation, Measurement & Analysis

Open Inventor Toolkit provides a comprehensive set of segmentation tools, as well as a complete range of data quantification capabilities:

Identification of objects, phases, defects, and regions of interest
Quantification of porosities, inclusions, cracks…
Counts, measures, statistical information

Open Inventor allows developers to easily create automated image analysis workflows in software applications. It offers a rich, high-performance library of components to perform advanced image segmentation, pattern recognition, for voids, cracks, or any defect detection.

Develop advanced image-based defect detection applications faster, at lower cost

Open Inventor Toolkit is a powerful library that empowers the development of image-based defect detection and quality control applications. It provides read-to-use powerful components that will allow inspection application makers to focus on their core expertise.
From electronics to industrial parts defect detection, inspection system development will benefit from pre-built image visualization and analysis components that will ensure cutting-edge visual inspection end-user capabilities while minimizing the time and cost in development and maintenance.